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scanning electron microscopy sem  (Hitachi Ltd)


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    Hitachi Ltd scanning electron microscopy sem
    Scanning Electron Microscopy Sem, supplied by Hitachi Ltd, used in various techniques. Bioz Stars score: 99/100, based on 152542 PubMed citations. ZERO BIAS - scores, article reviews, protocol conditions and more
    https://www.bioz.com/result/scanning electron microscopy sem/product/Hitachi Ltd
    Average 99 stars, based on 152542 article reviews
    scanning electron microscopy sem - by Bioz Stars, 2026-04
    99/100 stars

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    Schematics <t>and</t> <t>FE-SEM</t> images of layer stacks used for XRF investigation. One stack has an intermediate CdSe layer while the other does not; the total geometric thickness of CdTe is equivalent, but the sample with CdSe has large voids, indicating loss of CdTe.
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    Schematics and FE-SEM images of layer stacks used for XRF investigation. One stack has an intermediate CdSe layer while the other does not; the total geometric thickness of CdTe is equivalent, but the sample with CdSe has large voids, indicating loss of CdTe.

    Journal: Science and Technology of Advanced Materials

    Article Title: Formation of configurable uniform CdSeTe thin films by close-space sublimation deposition of multiple alternating CdSe and CdTe layers

    doi: 10.1080/14686996.2026.2633815

    Figure Lengend Snippet: Schematics and FE-SEM images of layer stacks used for XRF investigation. One stack has an intermediate CdSe layer while the other does not; the total geometric thickness of CdTe is equivalent, but the sample with CdSe has large voids, indicating loss of CdTe.

    Article Snippet: Absorber cross-sections were imaged with field emission scanning electron microscopy (FE-SEM) (Hitachi, Japan SU8000) using material and crystal orientation contrast of backscattered electrons.

    Techniques: